Langer EMV P202/P302 L-EFT Set Pulse Injection 1.5/5 ns &1.5/20 ns

The P202 L-EFT pulse-current generator is used for the conductive coupling of disturbance pulses into test ICs. During tests according to the standards IEC 61000-4-2 / ICE 61000-4-4 the P202 simuates the reduced disturbance pulses that have reached the IC. These disturbance-current pulses created during the test can result from magnetic-field coupling.

When a magnetic disturbance field couples into a low impedance loop connected to a pin of the test IC, a disturbance voltage will be induced. This voltage drives a disturbance current pulse into the IC pin and can lead to functional interferences. This coupling mechanism can be simulated by a low-impedance pulse-current source, such as the P202 generator (≈ 1 Ω). The pulse voltage is adjustable within the range of ± (0.5 - 40) V. The L-EFT generator is operated with the BPS 202 and the BPS 202-Client software. To test ICs at the measuring station the ICE1 test environment is required. For automated testing the ICE1 as well as the ICT1 IC tester is required. Additional equipment may be needed for other measurements (Oscilloscope, PC).

Technical parameters

Internal resistance	≈ 1 Ω
Coupling capacity	1.2 µF
Pulse parameter
Shape	1.5 / 5 ns
Frequency	0.1 Hz - 10 kHz
Voltage	± (0.4 - 40) V
Inductance	≈ 2 nH
Sizes (L x W x H)	(78 x 35 x 31) mm

The P302 L-EFT pulse-voltage generator is used for the conductive coupling of disturbance pulses into test ICs. During tests according to the standards IEC 61000-4-2 / ICE 61000-4-4 the P302 simuates the reduced disturbance pulses that have reached the IC. These disturbance-voltage pulses created during the test can result from electric-field coupling.

When an electrical disturbance field couples into the traces of a test IC, the disturbance voltage of the connected impedances will drop. This voltage drop occurs at the IC pins can lead to functional interferences. This coupling mechanism can be simulated by a high-impedance pulse-voltage source, such as the P302 generator (≈ 150 Ω). The pulse voltage is adjustable within the range of ± (5 - 500) V. The L-EFT generator is operated with the BPS 202 and the BPS 202-Client software. To test ICs at the measuring station the ICE1 test environment is required. For automated testing the ICE1 as well as the ICT1 IC tester is required. Additional equipment may be needed for other measurements (Oscilloscope, PC).

Technical parameters

Internal resistance	≈ 150 Ω
Coupling capacity	20 pF
Pulse parameter
Shape	1.5 / 20 ns
Frequency	0.1 Hz - 10 kHz
Voltage	± (5 - 500) V
Inductance	50 nH
Sizes (L x W x H)	(78 x 35 x 31) mm

The BPS 202 is used as power supply and control unit for the Langer EMV-Technik GmbH pulse probes. The control unit is connected to the user PC via an USB interface. BPS 202-Client software does the controlling. With the BPS 202 input "sync" interference pulses of the connected probes can be synchronized on the functional process of an IC.

Adjustment of the pulse frequency and pulse current || Single pulse or pulse sequence || External triggering possible || Adjustable trigger delay

Technical parameters

Output voltage	± (5 ... 500) V
External trigger input	TTL / BNC
Trigger-pulse delay (Bypass Mode - Delay Line)
min. Trigger-pulse delay (typ.)	30 ns
max. Jitter (typ.)	± 1 ns
Trigger-pulse delay (Timer Mode)
min. Trigger-pulse delay (typ.)	130 ns
max. Trigger-pulse delay (typ.)	100 ms
max. Jitter (typ.)	± 15 ns
Trigger delay, min. increment	10 ns
Supply voltage	12 V / 1 A DC
Weight	300 g
Sizes (L x W x H)	(175 x 122 x 51) mm
Software	BPS 202-Client / DLL (32 Bit / 64 Bit) Win XP SP3 or higher