This item is in great condition used Keithley 2001 7.5 Digit Multimeter DMM 7 1/2 Digit DMM. Calibrated to NIST standards on October 31, 2024 . Includes standard power cable, traceable certificate of calibration, and 180 day warranty. Please note that the device has a slight scratch on the back. All pictures are of the actual unit.
This item comes with a 6 Month (180 day) warranty. All functions are guaranteed to work or money will be refunded.
We Calibrate your Test Equipment! Contact us for more information on Calibration by visiting stratatek.com/calibration
This item is in-stock and located in Texas.
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Keithley 2001 Multimeter 7.5 Digit NIST Calibrated 7 1/2 DMM
The 2001 Series offers 7 ½ -digit resolution and basic DCV accuracy of 0.0018%, offering exceptional resolution, accuracy, and sensitivity. This high performance digital multimeter not only delivers performance specifications usually associated only with instruments that cost thousands more, but it also offers a broad range of functions not typically available in DMMs. For greater flexibility, a built-in card slot on the rear panel allows an additional multiplexer card for multi-point measurement applications.
Features
Benefits
True 7½-digit resolution based on 28-bit A/D converter Provides greater dynamic range, avoiding range-shift errors and delays Exceptional measurement integrity combined with high throughput
Tests precision components quickly and accurately in production environments Advanced AC measurements including Peak ACV, AC or AC+DC Coupling, RMS or average, and low frequency RMS Reduces the number of instruments in your test system Multiple measurement display Displays multiple measurements such as DC and AC volts and the AC frequency from a single measurement connection simultaneously, reducing the need for additional instruments Optional plug-in switch cards for multipoint measurements Simplify creating a self-contained, multipoint switch and measure solution Built-in bar graph display Tracks reading trends around a target value saving time from off-line measurement analysis Any questions or clarifications, feel free to ask
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